Mechanism of defects and electrode structure on the performance of AlN-based metal semiconductor metal detectors

	Mechanism of defects and electrode structure on the performance of AlN-based metal semiconductor metal detectors
	Li, Guanghui; Wang, Pengbo; He, Xinran; Meng, Yulong; Liang, Feng; Zhou, Mei; Zhao, Degang
刊名	MATERIALS RESEARCH EXPRESS
	2021
卷号	8 期号:12 页码:125902
公开日期	2021
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/30755]
专题	半导体研究所_光电子研究发展中心
推荐引用方式 GB/T 7714	Li, Guanghui; Wang, Pengbo; He, Xinran; Meng, Yulong; Liang, Feng; Zhou, Mei; Zhao, Degang. Mechanism of defects and electrode structure on the performance of AlN-based metal semiconductor metal detectors[J]. MATERIALS RESEARCH EXPRESS,2021,8(12):125902.
APA	Li, Guanghui; Wang, Pengbo; He, Xinran; Meng, Yulong; Liang, Feng; Zhou, Mei; Zhao, Degang.(2021).Mechanism of defects and electrode structure on the performance of AlN-based metal semiconductor metal detectors.MATERIALS RESEARCH EXPRESS,8(12),125902.
MLA	Li, Guanghui; Wang, Pengbo; He, Xinran; Meng, Yulong; Liang, Feng; Zhou, Mei; Zhao, Degang."Mechanism of defects and electrode structure on the performance of AlN-based metal semiconductor metal detectors".MATERIALS RESEARCH EXPRESS 8.12(2021):125902.