| Probing the edge-related properties of atomically thin MoS 2 at nanoscale | |
| Teng-Xiang Huang; Xin Cong; Si-Si Wu; Kai-Qiang Lin; Xu Yao; Yu-Han He; Jiang-Bin Wu; Yi-Fan Bao; Sheng-Chao Huang; Xiang Wang; Ping-Heng Tan; Bin Ren | |
| 刊名 | Nature communications
 |
| 2019 | |
| 卷号 | 10页码:5544 |
| 内容类型 | 期刊论文 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/29450]  |
| 专题 | 半导体研究所_半导体超晶格国家重点实验室 |
| 推荐引用方式 GB/T 7714 | Teng-Xiang Huang;Xin Cong;Si-Si Wu;Kai-Qiang Lin;Xu Yao;Yu-Han He;Jiang-Bin Wu;Yi-Fan Bao;Sheng-Chao Huang;Xiang Wang;Ping-Heng Tan;Bin Ren. Probing the edge-related properties of atomically thin MoS 2 at nanoscale[J]. Nature communications,2019,10:5544. |
| APA | Teng-Xiang Huang;Xin Cong;Si-Si Wu;Kai-Qiang Lin;Xu Yao;Yu-Han He;Jiang-Bin Wu;Yi-Fan Bao;Sheng-Chao Huang;Xiang Wang;Ping-Heng Tan;Bin Ren.(2019).Probing the edge-related properties of atomically thin MoS 2 at nanoscale.Nature communications,10,5544. |
| MLA | Teng-Xiang Huang;Xin Cong;Si-Si Wu;Kai-Qiang Lin;Xu Yao;Yu-Han He;Jiang-Bin Wu;Yi-Fan Bao;Sheng-Chao Huang;Xiang Wang;Ping-Heng Tan;Bin Ren."Probing the edge-related properties of atomically thin MoS 2 at nanoscale".Nature communications 10(2019):5544. |
| 个性服务 |
| 查看访问统计 |
| 相关权益政策 |
| 暂无数据 |
| 收藏/分享 |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论