| Image charge interaction correction in charged-defect calculations | |
| Zhao-Jun Suo; Jun-Wei Luo; Shu-Shen Li; Lin-Wang Wang | |
| 刊名 | PHYSICAL REVIEW B
 |
| 2020 | |
| 卷号 | 102页码:174110 |
| 内容类型 | 期刊论文 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/30012]  |
| 专题 | 半导体研究所_半导体超晶格国家重点实验室 |
| 推荐引用方式 GB/T 7714 | Zhao-Jun Suo; Jun-Wei Luo; Shu-Shen Li; Lin-Wang Wang. Image charge interaction correction in charged-defect calculations[J]. PHYSICAL REVIEW B,2020,102:174110. |
| APA | Zhao-Jun Suo; Jun-Wei Luo; Shu-Shen Li; Lin-Wang Wang.(2020).Image charge interaction correction in charged-defect calculations.PHYSICAL REVIEW B,102,174110. |
| MLA | Zhao-Jun Suo; Jun-Wei Luo; Shu-Shen Li; Lin-Wang Wang."Image charge interaction correction in charged-defect calculations".PHYSICAL REVIEW B 102(2020):174110. |
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