A single-ion monitor based on coincident measurement of secondary electrons for single event effect research

doi:10.1063/1.5145223

	A single-ion monitor based on coincident measurement of secondary electrons for single event effect research
	Jin, Ying 1,2; Zhang, Yuezhao 1; Liu, Junliang 1,2; Yu, Deyang 1,2; Wang, Hui 1; Meng, Jun 1,2; Guo, Tao 3; Hui, Xinfei 3; Li, Xiaoxiao 1,2
刊名	REVIEW OF SCIENTIFIC INSTRUMENTS
	2020-04-01
卷号	91 期号:4 页码:10
ISSN号	0034-6748
DOI	10.1063/1.5145223
通讯作者	Liu, Junliang(liujunliang@impcas.ac.cn) ; Yu, Deyang(d.yu@impcas.ac.cn)
英文摘要	Single-ion monitoring is a key requirement for many energetic heavy-ion experiments, e.g., the laboratory simulation of the single event effect of semiconductor devices under heavy ion bombardments. We have developed a two-dimensional position-sensitive and timing monitor of individual ions. It is composed of a thin aluminum foil, a pair of microchannel plate detectors, and electrostatic and magnetic fields. When energetic heavy ions pass through the aluminum foil, secondary electrons generated on each side of the foil are guided by the fields to the corresponding detector. Both the hitting position and the arrival time of the secondary electrons on corresponding detectors are measured in coincidence. A test with an Am-241 alpha source shows that the present monitor is capable of discriminating true events from heavy background radiations. A position resolution of 1.0 mm and a recording time resolution of 50 ns have been realized in the test.
资助项目	National Natural Science Foundation of China[11774356] ; National Natural Science Foundation of China[11405241] ; National Natural Science Foundation of China[11674333]
WOS关键词	MICROCHANNEL PLATE DETECTOR ; HEAVY-ION ; RESOLUTION
WOS研究方向	Instruments & Instrumentation ; Physics
语种	英语
出版者	AMER INST PHYSICS
WOS记录号	WOS:000529944100001
资助机构	National Natural Science Foundation of China
内容类型	期刊论文
源URL	[http://119.78.100.186/handle/113462/140522]
专题	中国科学院近代物理研究所
通讯作者	Liu, Junliang; Yu, Deyang
作者单位	1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 3.Lanzhou Univ, Sch Nucl Sci & Technol, Lanzhou 730000, Peoples R China
推荐引用方式 GB/T 7714	Jin, Ying,Zhang, Yuezhao,Liu, Junliang,et al. A single-ion monitor based on coincident measurement of secondary electrons for single event effect research[J]. REVIEW OF SCIENTIFIC INSTRUMENTS,2020,91(4):10.
APA	Jin, Ying.,Zhang, Yuezhao.,Liu, Junliang.,Yu, Deyang.,Wang, Hui.,...&Li, Xiaoxiao.(2020).A single-ion monitor based on coincident measurement of secondary electrons for single event effect research.REVIEW OF SCIENTIFIC INSTRUMENTS,91(4),10.
MLA	Jin, Ying,et al."A single-ion monitor based on coincident measurement of secondary electrons for single event effect research".REVIEW OF SCIENTIFIC INSTRUMENTS 91.4(2020):10.