Review of highly charged ion production with ECR ion source and the future opportunities for HCI physics | |
Sun, L.; Zhao, H. W.; Lu, W.; Guo, J. W.; Yang, Y.; Jia, H.; Lu, L.; Wu, W. | |
刊名 | X-RAY SPECTROMETRY
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2020 | |
卷号 | 49期号:1页码:47-53 |
ISSN号 | 0049-8246 |
DOI | 10.1002/xrs.3049 |
通讯作者 | Sun, L.(sunlt@impcas.ac.cn) |
英文摘要 | In recent years, there is very intense worldwide research and development work on electron cyclotron resonance ion source (ECRIS). Remarkable progress represented by the third generation superconducting ECRIS has been made with regards of intense highly charged ion beam production such as >600 e mu A Ar16+, >10 e mu A Ar18+, and hundreds of enA He-like Kr34+. A low energy heavy ion platform named Low Energy heavy ion Accelerator Facility (LEAF) that features a next generation 45 GHz ECRIS, a 300 kV high voltage platform, a 0.5 MeV/u radio-frequency quadrupole, and several multidisciplinary experimental terminals is under construction at the Institute of Modern Physics (IMP). This paper will report on the recent progress with ECRIS dedicated to highly charged ions and the status of LEAF at IMP that will provide new opportunities for highly charged ion physics in the near future. |
资助项目 | Chinese Academy of Sciences[QYZDB-SSW-JSC025] |
WOS研究方向 | Spectroscopy |
语种 | 英语 |
出版者 | WILEY |
WOS记录号 | WOS:000619145300010 |
资助机构 | Chinese Academy of Sciences |
内容类型 | 期刊论文 |
源URL | [http://119.78.100.186/handle/113462/138023] ![]() |
专题 | 中国科学院近代物理研究所 |
通讯作者 | Sun, L. |
作者单位 | Chinese Acad Sci, Linear Accelerator Ctr, Inst Modern Phys, Lanzhou 730000, Peoples R China |
推荐引用方式 GB/T 7714 | Sun, L.,Zhao, H. W.,Lu, W.,et al. Review of highly charged ion production with ECR ion source and the future opportunities for HCI physics[J]. X-RAY SPECTROMETRY,2020,49(1):47-53. |
APA | Sun, L..,Zhao, H. W..,Lu, W..,Guo, J. W..,Yang, Y..,...&Wu, W..(2020).Review of highly charged ion production with ECR ion source and the future opportunities for HCI physics.X-RAY SPECTROMETRY,49(1),47-53. |
MLA | Sun, L.,et al."Review of highly charged ion production with ECR ion source and the future opportunities for HCI physics".X-RAY SPECTROMETRY 49.1(2020):47-53. |
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