Performance of the Secondary Electrons Profile Monitor for the scanning gantry in the Heavy Ion Medical Machine

doi:10.1016/j.nima.2021.165212

	Performance of the Secondary Electrons Profile Monitor for the scanning gantry in the Heavy Ion Medical Machine
	Liu, Tong 1,2,3,4; Mao, Ruishi 3,4; Yuan, Youjin 3,4; Huang, Chuan 1; Yao, Liping 3,4; Yao, Ze'en 1; Xu, Zhiguo 3,4; Li, Peng 3; Feng, Yongchun 3; You, Yaoyao 3,4
刊名	NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
	2021-05-21
卷号	999 页码:8
关键词	Secondary electrons profile monitor Beam profile Microchannel plates HIMM
ISSN号	0168-9002
DOI	10.1016/j.nima.2021.165212
通讯作者	Xu, Zhiguo(xuzg@impcas.ac.cn)
英文摘要	A Secondary Electrons Profile Monitor (SEPM) is developed as part of the beam dose delivery system in a clinical gantry of the Heavy Ion Medical Machine (HIMM). With the purpose of less disturbance to the beam, a thin foil with a thickness of 0.7 mu m and an accelerating grid with a diameter of 15 mu m are employed to produce and accelerate the secondary electrons, and two microchannel plates (MCPs) are used to multiply the electrons. Providing the real-time information of beam size, position, flatness, and symmetry in front of the scanning magnet, the beam monitor features an active area of 989 mm(2), beam intensities between 1.0 x 10(3) to 1.0 x 10(8) particles per pulse (ppp) and a wide range of beam energies. A prototype is tested at the horizontal treatment room of the HIMM. Using different beam positions, sizes, and energies of C-12(6+) beams, test experiments show that the beam monitor maintains good consistency with a Multi-Strip Ionization Chamber (MSIC). Compared to the MSIC, the SEPM shows a better signal-to-noise ratio (SNR) and higher sensitivity to the variation of the beam.
资助项目	National Natural Science Foundation of China (NSFC)[1177581] ; Guangdong Innovative and Entrepreneurial Research Team Program, China[2016ZT06G373]
WOS关键词	BEAM MONITOR ; RESOLUTION ; DETECTOR ; DESIGN
WOS研究方向	Instruments & Instrumentation ; Nuclear Science & Technology ; Physics
语种	英语
出版者	ELSEVIER
WOS记录号	WOS:000636224700011
资助机构	National Natural Science Foundation of China (NSFC) ; Guangdong Innovative and Entrepreneurial Research Team Program, China
内容类型	期刊论文
源URL	[http://119.78.100.186/handle/113462/137559]
专题	中国科学院近代物理研究所
通讯作者	Xu, Zhiguo
作者单位	1.Lanzhou Univ, Lanzhou 730000, Peoples R China 2.Huizhou Res Ctr Ion Sci, Huizhou 516003, Peoples R China 3.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 4.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式 GB/T 7714	Liu, Tong,Mao, Ruishi,Yuan, Youjin,et al. Performance of the Secondary Electrons Profile Monitor for the scanning gantry in the Heavy Ion Medical Machine[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT,2021,999:8.
APA	Liu, Tong.,Mao, Ruishi.,Yuan, Youjin.,Huang, Chuan.,Yao, Liping.,...&He, Peilin.(2021).Performance of the Secondary Electrons Profile Monitor for the scanning gantry in the Heavy Ion Medical Machine.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT,999,8.
MLA	Liu, Tong,et al."Performance of the Secondary Electrons Profile Monitor for the scanning gantry in the Heavy Ion Medical Machine".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 999(2021):8.