Subtraction method via phase mask enables contrast enhancement in scanned Bessel light-sheet microscopy

doi:10.1364/JOSAA.37.000084

CORC > 上海应用物理研究所 > 中国科学院上海应用物理研究所 > 中科院上海应用物理研究所2011-2017年

	Subtraction method via phase mask enables contrast enhancement in scanned Bessel light-sheet microscopy
	Deng, SH ; Wang, P ; Zhang, YL ; Zhou, HL ; Yang, JZ ; Liu, MP
刊名	JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION
	2020
卷号	37 期号:1 页码:84-88
关键词	FLUORESCENCE MICROSCOPY DIFFRACTION DEEP
ISSN号	1084-7529
DOI	10.1364/JOSAA.37.000084
文献子类	期刊论文
英文摘要	We report on the generation of a hollow Bessel beam with a hole along the direction of propagation by using an easy-to-implement phase mask and investigate its effectiveness to reduce the out-of-focus background in light-sheet fluorescence microscopy (LSFM) with scanned Bessel beams by subtraction imaging. Overlaying pi-phase retardation between the two equal parts of the Bessel beam across the entrance pupil of the objective lens, a hollow Bessel beam with zero intensity at the focal plane can be achieved. By optimizing the numerical aperture of the annular mask applied in the hollow Bessel beam, matched distributions of the ring system between the hollow Bessel beam and the conventional Bessel beam are achieved. By subtraction between the two LSFM images, the out-of-focus blur caused by the ring system of the Bessel beam can be significantly reduced. Comparison with conventional Bessel LSFM images exhibits a better sectioning capability and higher contrast. (C) 2019 Optical Society of America
语种	英语
内容类型	期刊论文
源URL	[http://ir.sinap.ac.cn/handle/331007/33171]
专题	上海应用物理研究所_中科院上海应用物理研究所2011-2017年
作者单位	1.Chinese Acad Sci, Shanghai Inst Appl Phys, Div Phys Biol, Shanghai 201800, Peoples R China 2.Nanchang Univ, Sch Informat Engn, Nanchang 330031, Jiangxi, Peoples R China
推荐引用方式 GB/T 7714	Deng, SH,Wang, P,Zhang, YL,et al. Subtraction method via phase mask enables contrast enhancement in scanned Bessel light-sheet microscopy[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION,2020,37(1):84-88.
APA	Deng, SH,Wang, P,Zhang, YL,Zhou, HL,Yang, JZ,&Liu, MP.(2020).Subtraction method via phase mask enables contrast enhancement in scanned Bessel light-sheet microscopy.JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION,37(1),84-88.
MLA	Deng, SH,et al."Subtraction method via phase mask enables contrast enhancement in scanned Bessel light-sheet microscopy".JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION 37.1(2020):84-88.