Evolution of structure and electrical properties of epitaxial BiFeO3 thin films through solution and annealing atmosphere

doi:10.1016/j.jallcom.2020.155910

	Evolution of structure and electrical properties of epitaxial BiFeO3 thin films through solution and annealing atmosphere
	Jin, Linghua 2; Liu, Miao 1,3; Li, Chenhui 1,3; Song, Dongpo 4; Yang, Bingbing 3; Zhu, Xuebin 3
刊名	JOURNAL OF ALLOYS AND COMPOUNDS
	2020-11-30
卷号	843
关键词	Epitaxial BFO thin films Ferroelectric Precursor Annealing atmosphere
ISSN号	0925-8388
DOI	10.1016/j.jallcom.2020.155910
通讯作者	Jin, Linghua(jinlh@mail.ustc.edu.cn) ; Yang, Bingbing(yang00@mail.ustc.edu.cn)
英文摘要	Solution derived high-quality epitaxial BiFeO3 (BFO) thin films, with robust spontaneous polarization, are still desired because of their advantages. Herein, epitaxial BFO thin films and SrRuO3 bottom electrodes are prepared on LaAlO3 substrates via chemical solution deposition (CSD) technique. The influences of precursor solution on the microstructure and electrical properties are investigated by using nitrate salt and acetate salt system. The XRD and P-E hysteresis loops results demonstrate that the BFO thin film prepared by acetate salt system as a relatively green CSD route shows good epitaxial characteristic and ferroelectric performances. In addition, the effect of the annealing atmosphere on the microstructure and electrical properties are studied for the acetate salt derived BFO thin films. The microstructure and defects chemistry are analyzed by SEM and XPS, the BFO thin film annealed in air shows better comprehensive ferroelectric performances with the lowest leakage current and enhanced ferroelectric polarization due to the improved microstructure and decreased defect concentrations. The results here thus provide an instructive approach to optimize the growth of solution-derived epitaxial BFO-based thin films. (C) 2020 Elsevier B.V. All rights reserved.
资助项目	Scientific Research Foundation of Hunan Provincial Education Department, China[18C0440]
WOS关键词	FERROELECTRIC PROPERTIES ; DEPOSITION
WOS研究方向	Chemistry ; Materials Science ; Metallurgy & Metallurgical Engineering
语种	英语
出版者	ELSEVIER SCIENCE SA
WOS记录号	WOS:000556137400010
资助机构	Scientific Research Foundation of Hunan Provincial Education Department, China
内容类型	期刊论文
源URL	[http://ir.hfcas.ac.cn:8080/handle/334002/44953]
专题	中国科学院合肥物质科学研究院
通讯作者	Jin, Linghua; Yang, Bingbing
作者单位	1.Univ Sci & Technol China, Hefei 230026, Peoples R China 2.Univ South China, Sch Chem & Chem Engn, Hengyang 421001, Peoples R China 3.Chinese Acad Sci, Inst Solid State Phys, Key Lab Mat Phys, Hefei 230031, Peoples R China 4.Jiangsu Univ Sci & Technol, Dept Phys, Zhenjiang 212003, Jiangsu, Peoples R China
推荐引用方式 GB/T 7714	Jin, Linghua,Liu, Miao,Li, Chenhui,et al. Evolution of structure and electrical properties of epitaxial BiFeO3 thin films through solution and annealing atmosphere[J]. JOURNAL OF ALLOYS AND COMPOUNDS,2020,843.
APA	Jin, Linghua,Liu, Miao,Li, Chenhui,Song, Dongpo,Yang, Bingbing,&Zhu, Xuebin.(2020).Evolution of structure and electrical properties of epitaxial BiFeO3 thin films through solution and annealing atmosphere.JOURNAL OF ALLOYS AND COMPOUNDS,843.
MLA	Jin, Linghua,et al."Evolution of structure and electrical properties of epitaxial BiFeO3 thin films through solution and annealing atmosphere".JOURNAL OF ALLOYS AND COMPOUNDS 843(2020).