W-band Aperture-Type Scanning Near-Field Microscopy Using Tapered Plastic Probe

doi:10.1007/s10762-019-00603-2

	W-band Aperture-Type Scanning Near-Field Microscopy Using Tapered Plastic Probe
	Wang, Nan 3; Chang, Tianying 2,3; Cui, Hong-Liang1,3
刊名	JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES
	2019-07-01
卷号	40 期号:7 页码:801-810
关键词	W-band Near-field imaging Aperture-type scanning probe Plastic probe
ISSN号	1866-6892
DOI	10.1007/s10762-019-00603-2
通讯作者	Chang, Tianying(tchang@jlu.edu.cn)
英文摘要	An aluminum-coated PMMA tapered probe with 50 mu m aperture was employed in near-field imaging at 110GHz. The probe was chosen for near-field imaging experiments according to finite-difference time-domain electromagnetic simulation, analysis of antenna resonance, and impedance matching consideration. Imaging of a printed circuit board with a repeated structure of 450-mu m-wide metal strips spaced by 550-mu m-wide dielectric demonstrated a spatial resolution of 15 mu m (lambda/200), which is not just 100 times below the diffraction limit, but is 3 times smaller than the aperture size. Subsurface buried defect in a plastic plate (polytetrafluoroethylene defect in polyester fiber glass, 0.5mm below the top surface of the plate) was also imaged, with a spatial resolution of 1.5mm, and positioning error of the defect less than 0.5mm.
资助项目	National Natural Science Foundation of China[61705120] ; Ministry of Science and Technology of China[2015CB755401] ; Department of Science and Technology of Shandong Province[2017GGX10108] ; Department of Science and Technology of Shandong Province[2018GGX101043]
WOS研究方向	Engineering ; Optics ; Physics
语种	英语
出版者	SPRINGER
WOS记录号	WOS:000475584400009
内容类型	期刊论文
源URL	[http://119.78.100.138/handle/2HOD01W0/8314]
专题	中国科学院重庆绿色智能技术研究院
通讯作者	Chang, Tianying
作者单位	1.Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing 400714, Peoples R China 2.Qilu Univ Technol, Shandong Acad Sci, Inst Automat, Jinan 250014, Shandong, Peoples R China 3.Jilin Univ, Coll Instrumentat & Elect Engn, Changchun 130012, Jilin, Peoples R China
推荐引用方式 GB/T 7714	Wang, Nan,Chang, Tianying,Cui, Hong-Liang. W-band Aperture-Type Scanning Near-Field Microscopy Using Tapered Plastic Probe[J]. JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES,2019,40(7):801-810.
APA	Wang, Nan,Chang, Tianying,&Cui, Hong-Liang.(2019).W-band Aperture-Type Scanning Near-Field Microscopy Using Tapered Plastic Probe.JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES,40(7),801-810.
MLA	Wang, Nan,et al."W-band Aperture-Type Scanning Near-Field Microscopy Using Tapered Plastic Probe".JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES 40.7(2019):801-810.