Electric-Double-Layer Oriented Field-Screening Effect on High-Resolution Electromechanical Imaging in Conductive Solutions
Ye, Yan; Cui, Anyang; Zhu, Liangqing; Hu, Zhigao; Jiang, Kai; Shang, Liyan; Li, Yawei; Xu, Guisheng; Chu, Junhao
刊名PHYSICAL REVIEW APPLIED
2019-09-04
卷号12期号:3
ISSN号2331-7019
DOI10.1103/PhysRevApplied.12.034006
文献子类Article
英文摘要Complex electrical behavior, including the field-screening distribution and possible electrochemical effects, makes electromechanical imaging by piezoresponse force microscopy in conductive liquids a critical challenging issue in studying the functionalities and performance of piezoelectric materials. Here, we propose a theoretical model to directly quantify the electric-field-screening effect inside the tip-sample junction in a variety of electrolytes of varying ionic strength. The field-screening effect resulting from an electric double layer in the tip-surface system offers the benefit of better understanding of the central physical mechanism in electrical probing by scanning probe microscopy (SPM) in a polar liquid medium. Experimentally, an intrinsic piezoresponse in ferroelectric antiparallel-polarization regions is observed in electrolytes with various assemblies of valences and with various molarities through updating the design of a nanoelectrode probe. Accompanied by the unveiling of the underlying physical mechanism, these experimental results pave the way to the broad application of in vivo or in operando electrical analysis on the nanoscale by the SPM technique in conductive-liquid environments.
WOS研究方向Physics
语种英语
出版者AMER PHYSICAL SOC
内容类型期刊论文
源URL[http://ir.sic.ac.cn/handle/331005/26853]  
专题中国科学院上海硅酸盐研究所
推荐引用方式
GB/T 7714
Ye, Yan,Cui, Anyang,Zhu, Liangqing,et al. Electric-Double-Layer Oriented Field-Screening Effect on High-Resolution Electromechanical Imaging in Conductive Solutions[J]. PHYSICAL REVIEW APPLIED,2019,12(3).
APA Ye, Yan.,Cui, Anyang.,Zhu, Liangqing.,Hu, Zhigao.,Jiang, Kai.,...&Chu, Junhao.(2019).Electric-Double-Layer Oriented Field-Screening Effect on High-Resolution Electromechanical Imaging in Conductive Solutions.PHYSICAL REVIEW APPLIED,12(3).
MLA Ye, Yan,et al."Electric-Double-Layer Oriented Field-Screening Effect on High-Resolution Electromechanical Imaging in Conductive Solutions".PHYSICAL REVIEW APPLIED 12.3(2019).
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