Repair characteristics and time-dependent effects in Saccharomyces cerevisiae cells after X-ray irradiation

doi:10.1007/s11274-018-2566-9

	Repair characteristics and time-dependent effects in Saccharomyces cerevisiae cells after X-ray irradiation
	Guo, Xiaopeng 1,3; Zhang, Miaomiao1,2,3 ; Liu, Ruiyuan1,2,3 ; Gao, Yue 1,3; Yang, Yang 3; Li, Wenjian2,3 ; Lu, Dong2,3
刊名	WORLD JOURNAL OF MICROBIOLOGY & BIOTECHNOLOGY
	2019-01
卷号	35 页码:1
关键词	Radiation damage Double-strand breaks Cellular recovery dynamics Phenotypic and transcriptional profiles Saccharomyces cerevisiae
ISSN号	0959-3993
DOI	10.1007/s11274-018-2566-9
英文摘要	In this study, we examined the dynamics of phenotypic and transcriptional profiles in Saccharomyces cerevisiae following semi-lethal X-ray irradiation. Post-irradiation, reproductive death was revealed as the predominant form of death in S. cerevisiae and almost all the irradiated cells were physically present and intact. In addition, cell cycle arrest reached its peak and cell division was at its valley at 2h. Cell cycle arrest, cell division potential, DNA damage, and mitochondrial transmembrane potential (MTP) showed significant recovery at 4h (P>0.05 vs. control). The improvements of DNA damage and MTP decrease were evaluated as at least 77% and 84% for the original irradiated cells at 4h, respectively. In the transcriptional profile, the amount of differentially expressed genes (DEGs) and the fold change in the repair-related DEGs were highest at 1h post-irradiation and then decreased. The DEGs at 1h (but not 2h or 3h) were significantly enriched in gene ontology (GO) categories of detoxification (up) and antioxidant activity (up). Although the transcriptional profile supported the repair time frame observed in the phenotypic profile, the complete repair may take a longer duration as the transcriptional levels of several important repair-related DEGs did not show a decrease and the DNA repair-related pathways (up) were the major enriched pathway in Kyoto Encyclopaedia of Genes and Genomes pathway analysis throughout the whole course of the study. These results provide an important reference for the selection of key time points in further studies.
资助项目	Industrial Technology Research Institute[CAS-ITRI 201801]
WOS关键词	INDUCED DNA-DAMAGE ; IONIZING-RADIATION ; REPRODUCTIVE DEATH ; STRAND BREAKS ; PROTEIN ; MECHANISMS ; GENERATION
WOS研究方向	Biotechnology & Applied Microbiology
语种	英语
出版者	SPRINGER
WOS记录号	WOS:000452770100001
内容类型	期刊论文
源URL	[http://119.78.100.186/handle/113462/64462]
专题	中国科学院近代物理研究所
通讯作者	Lu, Dong
作者单位	1.Univ Chinese Acad Sci, Coll Life Sci, Beijing 100049, Peoples R China 2.Key Lab Microbial Resources Exploitat & Applicat, Lanzhou 730000, Gansu, Peoples R China 3.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Gansu, Peoples R China
推荐引用方式 GB/T 7714	Guo, Xiaopeng,Zhang, Miaomiao,Liu, Ruiyuan,et al. Repair characteristics and time-dependent effects in Saccharomyces cerevisiae cells after X-ray irradiation[J]. WORLD JOURNAL OF MICROBIOLOGY & BIOTECHNOLOGY,2019,35:1.
APA	Guo, Xiaopeng.,Zhang, Miaomiao.,Liu, Ruiyuan.,Gao, Yue.,Yang, Yang.,...&Lu, Dong.(2019).Repair characteristics and time-dependent effects in Saccharomyces cerevisiae cells after X-ray irradiation.WORLD JOURNAL OF MICROBIOLOGY & BIOTECHNOLOGY,35,1.
MLA	Guo, Xiaopeng,et al."Repair characteristics and time-dependent effects in Saccharomyces cerevisiae cells after X-ray irradiation".WORLD JOURNAL OF MICROBIOLOGY & BIOTECHNOLOGY 35(2019):1.