Manufacture of phase-shifting diffraction grating
KOBAYASHI AKIRO
1990-01-24
著作权人NEC CORP
专利号JP1990021681A
国家日本
文献子类发明申请
其他题名Manufacture of phase-shifting diffraction grating
英文摘要PURPOSE:To prevent an abnormal growth at the time of an epitaxial growth and to contrive the stabilization of characteristics by a method wherein the whole surface of a phase shift region is exposed to light. CONSTITUTION:An N-type photoresist layer 2 is applied on an InP semiconductor substrate 1 and after a heat treatment is performed, an intermediate layer 3 and a phase shift layer 4 are applied and a heat treatment is performed. Then, an exposure is performed, the layer 4 is developed and part of the layer 4 is removed to form the layer 4 by patterning. After that, the substrate 1 is slanted at a certain angle and is exposed to light with two laser beams 5a and 5b intersecting each other by a two-flux interference exposure. After this, a phase shift part is selectively exposed to light with an He-Cd laser beam 6 using a photomask 14. After that, by removing the layer 3, the layer 4 is also removed simultaneously, and thereafter, the layer 2 is developed to pattern. After that, the substrate is etched using the patterned photoresist layer as mask. In this etching, the phase shift part remains flat because the resist layer is left on the whole surface. After that, by removing the photoresist layer, a diffraction grating is formed.
公开日期1990-01-24
申请日期1988-07-08
状态失效
内容类型专利
源URL[http://ir.opt.ac.cn/handle/181661/66129]  
专题半导体激光器专利数据库
作者单位NEC CORP
推荐引用方式
GB/T 7714
KOBAYASHI AKIRO. Manufacture of phase-shifting diffraction grating. JP1990021681A. 1990-01-24.
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace