Manufacture of phase-shifting diffraction grating | |
KOBAYASHI AKIRO | |
1990-01-24 | |
著作权人 | NEC CORP |
专利号 | JP1990021681A |
国家 | 日本 |
文献子类 | 发明申请 |
其他题名 | Manufacture of phase-shifting diffraction grating |
英文摘要 | PURPOSE:To prevent an abnormal growth at the time of an epitaxial growth and to contrive the stabilization of characteristics by a method wherein the whole surface of a phase shift region is exposed to light. CONSTITUTION:An N-type photoresist layer 2 is applied on an InP semiconductor substrate 1 and after a heat treatment is performed, an intermediate layer 3 and a phase shift layer 4 are applied and a heat treatment is performed. Then, an exposure is performed, the layer 4 is developed and part of the layer 4 is removed to form the layer 4 by patterning. After that, the substrate 1 is slanted at a certain angle and is exposed to light with two laser beams 5a and 5b intersecting each other by a two-flux interference exposure. After this, a phase shift part is selectively exposed to light with an He-Cd laser beam 6 using a photomask 14. After that, by removing the layer 3, the layer 4 is also removed simultaneously, and thereafter, the layer 2 is developed to pattern. After that, the substrate is etched using the patterned photoresist layer as mask. In this etching, the phase shift part remains flat because the resist layer is left on the whole surface. After that, by removing the photoresist layer, a diffraction grating is formed. |
公开日期 | 1990-01-24 |
申请日期 | 1988-07-08 |
状态 | 失效 |
内容类型 | 专利 |
源URL | [http://ir.opt.ac.cn/handle/181661/66129] ![]() |
专题 | 半导体激光器专利数据库 |
作者单位 | NEC CORP |
推荐引用方式 GB/T 7714 | KOBAYASHI AKIRO. Manufacture of phase-shifting diffraction grating. JP1990021681A. 1990-01-24. |
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