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	High-speed measuring system for semiconductor laser characteristic
	NOZAKI GAKUO
	1991-03-07
著作权人	NEC CORP
专利号	JP1991053132A
国家	日本
文献子类	发明申请
其他题名	High-speed measuring system for semiconductor laser characteristic
英文摘要	PURPOSE:To decide whether the characteristic is good or not by subjecting an optical output power characteristic curve to polar coordinate transformation and dividing it to blocks and extracting a straight line passing the largest number of points and calculating the absolute value of the difference between this straight line and the optical output power. CONSTITUTION:A current driving part 1 generates a driving current (a) to cause a differentiating circuit 2 to output a differential current (b) and to cause a semiconductor laser 3 to output an optical power (c). The optical power (c) is inputted to an optical signal measuring circuit 4 and this circuit 4 generates an optical power signal (d), and the signal (d) and the current (b) are inputted to an A/D converting circuit 5 and this circuit 5 outputs a two-dimensional data signal (e) to a microprocessor (MP) 6. The MP 6 divides curve data obtained by polar coordinate transformation of the differential current-optical power output characteristic into blocks and executes the parallel operation to quickly extract the inclination of the straight line and calculates the disturbance of the differential I-L characteristic waveform based on this decided straight line data and compares it with the waveform standard and discriminates whether it is good or not.
公开日期	1991-03-07
申请日期	1989-07-21
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/62624]
专题	半导体激光器专利数据库
作者单位	NEC CORP
推荐引用方式 GB/T 7714	NOZAKI GAKUO. High-speed measuring system for semiconductor laser characteristic. JP1991053132A. 1991-03-07.

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