Laser arrangement, method for controlling a laser and measuring method
HAPPACH, MAGNUS; DE FELIPE MESQUIDA, DAVID; SCHELL, MARTIN; KEIL, NORBERT
2018-12-19
著作权人FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E.V.
专利号EP3414804A1
国家欧洲专利局
文献子类发明申请
其他题名Laser arrangement, method for controlling a laser and measuring method
英文摘要The invention relates to a laser arrangement, comprising a laser (2) having a laser cavity (20); a least one cavity (30) external to the laser (2) which reflects one part of the light emitted by the laser (2) back into the laser cavity (20); a voltage measuring device (4) for measuring a voltage on an active section (21) of the laser (2), wherein an imbalance of the emission wave length of the laser (2) and/or a property of a material adjacent to the external cavity (30) can be determined. According to the invention, the external cavity (30) comprises an optical waveguide (34) coupled to the laser (2). The invention also relates to a method for controlling a laser and to a measuring method.
公开日期2018-12-19
申请日期2017-02-10
状态申请中
内容类型专利
源URL[http://ir.opt.ac.cn/handle/181661/57551]  
专题半导体激光器专利数据库
作者单位FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E.V.
推荐引用方式
GB/T 7714
HAPPACH, MAGNUS,DE FELIPE MESQUIDA, DAVID,SCHELL, MARTIN,et al. Laser arrangement, method for controlling a laser and measuring method. EP3414804A1. 2018-12-19.
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