Method of fabricating a semiconductor optical device
HIRATA, TAKAAKI
1992-09-08
著作权人OPTICAL MEASUREMENT TECHNOLOGY DEVELOPMENT CO., LTD.
专利号US5145792
国家美国
文献子类授权发明
其他题名Method of fabricating a semiconductor optical device
英文摘要A semiconductor optical device having a quantum well structure which can easily integrate plural optical devices of band gaps which are different from each other, and yet can achieve a high coupling coefficient by means of disordering the quantum well structure to form a waveguide region except for the portion which is used as an active region. Non-absorbing edges can be formed on the semiconductor laser on the optically integrated circuits by disordering the facets of the quantum well structure with ion implantation and thermal processing.
公开日期1992-09-08
申请日期1991-11-27
状态失效
内容类型专利
源URL[http://ir.opt.ac.cn/handle/181661/46216]  
专题半导体激光器专利数据库
作者单位OPTICAL MEASUREMENT TECHNOLOGY DEVELOPMENT CO., LTD.
推荐引用方式
GB/T 7714
HIRATA, TAKAAKI. Method of fabricating a semiconductor optical device. US5145792. 1992-09-08.
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