QQ客服 官方微博 反馈留言

	N and K measurement of MCT and PST by polarized reflectometry
	Wu Fei-Fei; Song Wenzhen; Yu Hui-Fen; Jiang Runqing; Li Xiangyang; Liu Zhaopeng
刊名	Proceedings of SPIE - The International Society for Optical Engineering
	1994
卷号	2274页码:188-191
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/6809985
专题	山东大学
作者单位	1.Shandong, China 2.Shandong, China 3.Shandong, China 4.[ Jiang, Ru
推荐引用方式 GB/T 7714	Wu Fei-Fei,Song Wenzhen,Yu Hui-Fen,et al. N and K measurement of MCT and PST by polarized reflectometry[J]. Proceedings of SPIE - The International Society for Optical Engineering,1994,2274:188-191.
APA	Wu Fei-Fei,Song Wenzhen,Yu Hui-Fen,Jiang Runqing,Li Xiangyang,&Liu Zhaopeng.(1994).N and K measurement of MCT and PST by polarized reflectometry.Proceedings of SPIE - The International Society for Optical Engineering,2274,188-191.
MLA	Wu Fei-Fei,et al."N and K measurement of MCT and PST by polarized reflectometry".Proceedings of SPIE - The International Society for Optical Engineering 2274(1994):188-191.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。