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	Properties of the oxidation on Hg1-xCdxTe by ellipsometry
	Hu Xierong; Jiang Runqing; Wu Fei-Fei; Zhang Shuzhi; Li Xiangyang; Fang Jiaxiong; Xu Guosen; Shen Jie; Deng (等)
刊名	Proceedings of SPIE - The International Society for Optical Engineering
	1994
卷号	2274页码:204-208
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/6809978
专题	山东大学
作者单位	1.Shandong, China 2.Shandong, China 3.Shandong, China 4.[ Zhang, S
推荐引用方式 GB/T 7714	Hu Xierong,Jiang Runqing,Wu Fei-Fei,et al. Properties of the oxidation on Hg1-xCdxTe by ellipsometry[J]. Proceedings of SPIE - The International Society for Optical Engineering,1994,2274:204-208.
APA	Hu Xierong.,Jiang Runqing.,Wu Fei-Fei.,Zhang Shuzhi.,Li Xiangyang.,...&Deng .(1994).Properties of the oxidation on Hg1-xCdxTe by ellipsometry.Proceedings of SPIE - The International Society for Optical Engineering,2274,204-208.
MLA	Hu Xierong,et al."Properties of the oxidation on Hg1-xCdxTe by ellipsometry".Proceedings of SPIE - The International Society for Optical Engineering 2274(1994):204-208.

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