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	On the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization
	Jiang, Bo; Zhai, Ke; Chan, W. K.; Tse, T. H.; Zhang, Zhenyu
刊名	INFORMATION AND SOFTWARE TECHNOLOGY
	2013
卷号	55页码:897-917
关键词	Testing-debugging integration Test case prioritization Fault localization Adequacy criterion MC/DC
ISSN号	0950-5849
DOI	10.1016/j.infsof.2012.10.001
URL标识	查看原文
收录类别	SCIE
WOS记录号	WOS:000317327000008
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/6569011
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Jiang, Bo,Zhai, Ke,Chan, W. K.,et al. On the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization[J]. INFORMATION AND SOFTWARE TECHNOLOGY,2013,55:897-917.
APA	Jiang, Bo,Zhai, Ke,Chan, W. K.,Tse, T. H.,&Zhang, Zhenyu.(2013).On the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization.INFORMATION AND SOFTWARE TECHNOLOGY,55,897-917.
MLA	Jiang, Bo,et al."On the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization".INFORMATION AND SOFTWARE TECHNOLOGY 55(2013):897-917.

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