CORC  > 北京航空航天大学
Model based FMEA for electronic products
Cui, Jingjing; Ren, Yi; Yang, Dezhen; Zeng, Shengkui
2015
会议名称PROCEEDINGS OF THE 2015 FIRST INTERNATIONAL CONFERENCE ON RELIABILITY SYSTEMS ENGINEERING 2015 ICRSE
会议日期2015-01-01
关键词FMEA failure mechanism failure mode failure model effect analysis
收录类别EI ; CPCI-S
URL标识查看原文
WOS记录号WOS:000380485700049
内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/6537308
专题北京航空航天大学
推荐引用方式
GB/T 7714
Cui, Jingjing,Ren, Yi,Yang, Dezhen,et al. Model based FMEA for electronic products[C]. 见:PROCEEDINGS OF THE 2015 FIRST INTERNATIONAL CONFERENCE ON RELIABILITY SYSTEMS ENGINEERING 2015 ICRSE. 2015-01-01.
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