| The Finite Element Analysis for Reliability of Built-DFH in Magnetic Head | |
| Xiao, Xiang-Hui; Peng, Min-Fang; Li, Fu-Hai; Zhan, Jie; Tang, Rong-Jun | |
| 刊名 | Acta Electronica Sinica
 |
| 2012 | |
| 卷号 | Vol.40 No.10页码:2140-2144 |
| 关键词 | DFH Dynamic Flying Height reliability analysis finite element thermal effects current crowded effect |
| ISSN号 | 0372-2112 |
| URL标识 | 查看原文 |
| 公开日期 | [db:dc_date_available] |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/6508886 |
| 专题 | 湖南大学 |
| 作者单位 | 1.Institute of Elec. and Information Engineering in Hunan University, Changsha, Hunan 410082, China 2.School of Physics in Hunan University of Science and Technology, Xiangtan, Hunan 411201, China 3.Japan's TDK Groups, Dongguan, Guangdong 523000, Ch |
| 推荐引用方式 GB/T 7714 | Xiao, Xiang-Hui,Peng, Min-Fang,Li, Fu-Hai,et al. The Finite Element Analysis for Reliability of Built-DFH in Magnetic Head[J]. Acta Electronica Sinica,2012,Vol.40 No.10:2140-2144. |
| APA | Xiao, Xiang-Hui,Peng, Min-Fang,Li, Fu-Hai,Zhan, Jie,&Tang, Rong-Jun.(2012).The Finite Element Analysis for Reliability of Built-DFH in Magnetic Head.Acta Electronica Sinica,Vol.40 No.10,2140-2144. |
| MLA | Xiao, Xiang-Hui,et al."The Finite Element Analysis for Reliability of Built-DFH in Magnetic Head".Acta Electronica Sinica Vol.40 No.10(2012):2140-2144. |
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