Characteristics of oxide-free InGaAlAs layers grown by narrow stripe selective MOVPE | |
Pan JQ | |
刊名 | semiconductor science and technology |
2005 | |
卷号 | 20期号:10页码:1083-1086 |
关键词 | VAPOR-PHASE EPITAXY |
ISSN号 | 0268-1242 |
通讯作者 | feng, w, chinese acad sci, inst semicond, optoelect res & dev ctr, pob 912, beijing 100083, peoples r china. 电子邮箱地址: wfeng@semi.ac.cn |
中文摘要 | narrow stripe selective movpe has been used to grow high quality oxide-free ingaalas layers on an inp substrate patterned with sio2 masks at optimized growth conditions. mirror-like surface morphologies and abrupt cross sections are obtained in all samples without spike growth at the mask edge. for the narrow stripe selectively grown ingaalas layers with a mesa width of about 1.2 mu m, a bandgap wavelength shift of 70 nm, a photoluminescence (pl) intensity of more than 80% and a pl full width at half maximum (fwhm) of less than 60 mev are obtained simultaneously with a small mask width variation from 0 to 40 mu m. the characteristics of the thickness enhancement ratio and the pl spectrum dependence on the mask width are presented and explained by considering both the migration effect from a masked region and the lateral vapour diffusion effect. |
学科主题 | 光电子学 |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2010-03-17 |
内容类型 | 期刊论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/8430] |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Pan JQ. Characteristics of oxide-free InGaAlAs layers grown by narrow stripe selective MOVPE[J]. semiconductor science and technology,2005,20(10):1083-1086. |
APA | Pan JQ.(2005).Characteristics of oxide-free InGaAlAs layers grown by narrow stripe selective MOVPE.semiconductor science and technology,20(10),1083-1086. |
MLA | Pan JQ."Characteristics of oxide-free InGaAlAs layers grown by narrow stripe selective MOVPE".semiconductor science and technology 20.10(2005):1083-1086. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论