Effect of the N/Al ratio of AlN buffer on the crystal properties and stress state of GaN film grown on Si(111) substrate
Zhao DG
刊名journal of crystal growth
2004
卷号260期号:3-4页码:331-335
关键词full-width at half-maximum
ISSN号0022-0248
通讯作者wu, m, chinese acad sci, inst semicond, state key lab integrated optoelect, pob 912, beijing 100083, peoples r china.
中文摘要the effect of the n/al ratio of aln buffers on the optical and crystal quality of gan films, grown by metalorganic chemical vapor deposition on si(111) substrates, has been investigated. by optimizing the n/al ratio during the aln buffer, the threading dislocation density and the tensile stress have been decreased. high-resolution x-ray diffraction exhibited a (0002) full-width at half-maximum as low as 396 acrsec. the variations of the tensile stress existing in the gan films were approved by the redshifts of the donor bound exiton peaks in the low-temperature photoluminescence measurement at 77 k. (c) 2003 elsevier b.v. all rights reserved.
学科主题光电子学
收录类别SCI
语种英语
公开日期2010-03-09
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/8226]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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Zhao DG. Effect of the N/Al ratio of AlN buffer on the crystal properties and stress state of GaN film grown on Si(111) substrate[J]. journal of crystal growth,2004,260(3-4):331-335.
APA Zhao DG.(2004).Effect of the N/Al ratio of AlN buffer on the crystal properties and stress state of GaN film grown on Si(111) substrate.journal of crystal growth,260(3-4),331-335.
MLA Zhao DG."Effect of the N/Al ratio of AlN buffer on the crystal properties and stress state of GaN film grown on Si(111) substrate".journal of crystal growth 260.3-4(2004):331-335.
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