Effects of Al2O3 on Thermal Stability and Electrical Reliability of HfO2 Film on Strained SiGe
Xu, DP ; Wan, L ; Cheng, XH(重点实验室) ; He, DW ; Song, ZR ; Yu, YH(重点实验室) ; Shen, DS
刊名RARE METAL MATERIALS AND ENGINEERING
2011
卷号40期号:8页码:1344-1347
关键词Materials Science Multidisciplinary Metallurgy & Metallurgical Engineering
ISSN号1002-185X
学科主题Materials Science; Metallurgy & Metallurgical Engineering
收录类别SCI
公开日期2013-05-10
内容类型期刊论文
源URL[http://ir.sim.ac.cn/handle/331004/115133]  
专题上海微系统与信息技术研究所_信息功能材料国家重点实验室2008-2012_期刊论文
推荐引用方式
GB/T 7714
Xu, DP,Wan, L,Cheng, XH,et al. Effects of Al2O3 on Thermal Stability and Electrical Reliability of HfO2 Film on Strained SiGe[J]. RARE METAL MATERIALS AND ENGINEERING,2011,40(8):1344-1347.
APA Xu, DP.,Wan, L.,Cheng, XH.,He, DW.,Song, ZR.,...&Shen, DS.(2011).Effects of Al2O3 on Thermal Stability and Electrical Reliability of HfO2 Film on Strained SiGe.RARE METAL MATERIALS AND ENGINEERING,40(8),1344-1347.
MLA Xu, DP,et al."Effects of Al2O3 on Thermal Stability and Electrical Reliability of HfO2 Film on Strained SiGe".RARE METAL MATERIALS AND ENGINEERING 40.8(2011):1344-1347.
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