Effects of TMIn flow on the interface and optical properties of InGaN/GaN mutiple quantum wells
Liu JP ; Jin RQ ; Zhu JJ ; Zhang JC ; Wang JF ; Wu M ; Chen J ; Wang YT ; Yang H
刊名journal of crystal growth
2004
卷号264期号:1-3页码:53-57
关键词high-resolution X-ray diffraction
ISSN号0022-0248
通讯作者liu, jp, chinese acad sci, inst semicond, state key lab integrated optoelect, pob 912, beijing 100083, peoples r china. 电子邮箱地址: jpliu@red.semi.ac.cn
中文摘要the effects of pre-tmin flow prior to qw growth and tmin flow rates during qw growth on the interface and optical properties of ingan/gan mqws were investigated. pre-depositing indium prior to qw growth and an appropriate tmin flow rate can improve the interface abruptness and increase the el intensity. ingan/gan mqws with improved interface abruptness have increasing emission intensity and wavelength. we attribute the interface improvement and the increase of el intensity to the improvement of the indium compositional profiles. (c) 2004 elsevier b.v. all rights reserved.
学科主题光电子学
收录类别SCI
语种英语
公开日期2010-03-09
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/8138]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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Liu JP,Jin RQ,Zhu JJ,et al. Effects of TMIn flow on the interface and optical properties of InGaN/GaN mutiple quantum wells[J]. journal of crystal growth,2004,264(1-3):53-57.
APA Liu JP.,Jin RQ.,Zhu JJ.,Zhang JC.,Wang JF.,...&Yang H.(2004).Effects of TMIn flow on the interface and optical properties of InGaN/GaN mutiple quantum wells.journal of crystal growth,264(1-3),53-57.
MLA Liu JP,et al."Effects of TMIn flow on the interface and optical properties of InGaN/GaN mutiple quantum wells".journal of crystal growth 264.1-3(2004):53-57.
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