Dislocation scattering in a two-dimensional electron gas of an AlxGa1-xN/GaN heterostructure | |
Han XX; Li DB | |
刊名 | physica status solidi b-basic research |
2004 | |
卷号 | 241期号:13页码:3000-3008 |
关键词 | FIELD-EFFECT TRANSISTORS |
ISSN号 | 0370-1972 |
通讯作者 | han, xx, chinese acad sci, inst semicond, key lab semicond mat sci, pob 912, beijing 100083, peoples r china. 电子邮箱地址: xxhan@red.semi.ac.cn |
中文摘要 | the theoretical electron mobility limited by dislocation scattering of a two-dimensional electron gas confined near the interface of an alxga1-xn/gan heterostructure is calculated. the accurate wave functions and electron distributions of the three lowest subbands for a typical structure are obtained by solving the schrodinger and poisson equations self-consistently. based on the model of treating dislocation as a charged line, a simple scattering potential, a square-well potential, is utilized. the estimated mobility suggests that such a choice can simplify the calculation without introducing significant deviation from experimental data. it is also found that the dislocation scattering dominates both the low- and moderate-temperature mobilities and accounts for the nearly flattening-out behavior with increasing temperature. to clarify the role of dislocation scattering all standard scattering mechanisms are included in the calculation. |
学科主题 | 半导体材料 |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2010-03-09 |
内容类型 | 期刊论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/7912] |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Han XX,Li DB. Dislocation scattering in a two-dimensional electron gas of an AlxGa1-xN/GaN heterostructure[J]. physica status solidi b-basic research,2004,241(13):3000-3008. |
APA | Han XX,&Li DB.(2004).Dislocation scattering in a two-dimensional electron gas of an AlxGa1-xN/GaN heterostructure.physica status solidi b-basic research,241(13),3000-3008. |
MLA | Han XX,et al."Dislocation scattering in a two-dimensional electron gas of an AlxGa1-xN/GaN heterostructure".physica status solidi b-basic research 241.13(2004):3000-3008. |
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