Lattice polarity detection of InN by circular photogalvanic effect
Zhang Q ; Wang XQ ; He XW ; Yin CM ; Xu FJ ; Shen B ; Chen YH ; Wang ZG ; Ishitani Y ; Yoshikawa A
刊名applied physics letters
2009
卷号95期号:3页码:art. no. 031902
关键词III-V semiconductors indium compounds nondestructive testing photoconductivity radiation effects semiconductor thin films wide band gap semiconductors
ISSN号0003-6951
通讯作者zhang q peking univ sch phys state key lab artificial microstruct & mesoscop p beijing 100871 peoples r china. e-mail address: wangshi@pku.edu.cn ; bshen@pku.edu.cn
中文摘要we report an effective and nondestructive method based on circular photogalvanic effect (cpge) to detect the lattice polarity of inn. because of the lattice inversion between in- and n-polar inn, the energy band spin splitting is opposite for inn films with different polarities. consequently under light irradiation with the same helicity, cpge photocurrents in in- and n-polar layers will have opposite directions, thus the polarity can be detected. this method is demonstrated by our cpge measurements in both n- and p-type inn films.
学科主题半导体物理
收录类别SCI
资助信息national natural science foundation of china 60806042 107740016073603360890193national basic research program of china 2006cb604908 2006cb921607 research fund for doctoral program of higher education in china 200800011021 20060001018nsfc 60625402
语种英语
公开日期2010-03-08
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/7067]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Zhang Q,Wang XQ,He XW,et al. Lattice polarity detection of InN by circular photogalvanic effect[J]. applied physics letters,2009,95(3):art. no. 031902.
APA Zhang Q.,Wang XQ.,He XW.,Yin CM.,Xu FJ.,...&Yoshikawa A.(2009).Lattice polarity detection of InN by circular photogalvanic effect.applied physics letters,95(3),art. no. 031902.
MLA Zhang Q,et al."Lattice polarity detection of InN by circular photogalvanic effect".applied physics letters 95.3(2009):art. no. 031902.
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