Strong visible and infrared photoluminescence from Er-implanted silicon nitride films
Chen P
刊名journal of physics d-applied physics
2008
卷号41期号:13页码:art. no. 135101
关键词1.54 MU-M
ISSN号0022-3727
通讯作者ding, wc, chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china. 电子邮箱地址: wcd04@semi.ac.cn
中文摘要silicon nitride films were deposited by plasma-enhanced chemical-vapour deposition. the films were then implanted with erbium ions to a concentration of 8 x 10(20) cm(-3). after high temperature annealing, strong visible and infrared photoluminescence (pl) was observed. the visible pl consists mainly of two peaks located at 660 and 750 nm, which are considered to originate from silicon nanocluster (si-ncs) and si-nc/sinx interface states. raman spectra and hrtem measurements have been performed to confirm the existence of si-ncs. the implanted erbium ions are possibly activated by an energy transfer process, leading to a strong 1.54 mu m pl.
学科主题光电子学
收录类别SCI
语种英语
公开日期2010-03-08
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/6618]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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Chen P. Strong visible and infrared photoluminescence from Er-implanted silicon nitride films[J]. journal of physics d-applied physics,2008,41(13):art. no. 135101.
APA Chen P.(2008).Strong visible and infrared photoluminescence from Er-implanted silicon nitride films.journal of physics d-applied physics,41(13),art. no. 135101.
MLA Chen P."Strong visible and infrared photoluminescence from Er-implanted silicon nitride films".journal of physics d-applied physics 41.13(2008):art. no. 135101.
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