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	Influence of RTA on the structures of BTO thin films and their physical properties
	Wang, M; Wang, H; Su, XJ; Wang, Z; Lin, CL
	1997
会议名称	1st Asian Meeting on Ferroelectrics (AMF01) / 2nd East Asia Conf on Chemical Sensors (EACCS-2) / Int Conf on Electronic Components and Materials / Int Conf on Sensors and Actuators (ICECM-ICSA 95)
会议日期	OCT 05-08, 1995
卷号	195
期号	1-4
DOI	10.1080/00150199708260527
页码	229-232
收录类别	CPCI-S ; SCOPUS ; SCIE
会议录	FERROELECTRICS
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/6090196
专题	山东大学
作者单位	ACAD SINICA,INST MET,SHANGHAI 200050,PEOPLES R CHINA.
推荐引用方式 GB/T 7714	Wang, M,Wang, H,Su, XJ,et al. Influence of RTA on the structures of BTO thin films and their physical properties[C]. 见:1st Asian Meeting on Ferroelectrics (AMF01) / 2nd East Asia Conf on Chemical Sensors (EACCS-2) / Int Conf on Electronic Components and Materials / Int Conf on Sensors and Actuators (ICECM-ICSA 95). OCT 05-08, 1995.

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