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	Micro assembled fourier transform spectrometer (EI CONFERENCE)
	Kong Y.-M. ; Liang J.-Q. ; Liang Z.-Z. ; Wang B. ; Zhang J.
	2009
会议名称	4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008
会议地点	Chengdu, China
关键词	With the trend of minimization of Fourier transform spectrometer (FTS) which is particularly pronounced in many applications a model of a micro FTS with no moving parts is proposed and analyzed. During analyzng the gradients which mainly introduce phase error are accounted. Based on these assumptions and the improved Mertz phase correcting method the spectrum of signal is simulated with real extended light source. The resolution can be up to 3.43nm@800nm with high signal-to-noise ratio (SNR) limiting resolving ability 6.8dB. In addition the fabrication method of components are illuminated and demonstrated which can not only make it bear some advantages over conventional micro dispersive spectrometers but also afford some new concepts on the design of spectrometers with improved performance. 2009 SPIE.
收录类别	EI
内容类型	会议论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/33849]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Kong Y.-M.,Liang J.-Q.,Liang Z.-Z.,et al. Micro assembled fourier transform spectrometer (EI CONFERENCE)[C]. 见:4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008. Chengdu, China.

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