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	Electro-optical imaging system identification using pseudo-random binary pattern (EI CONFERENCE)
	Le Y. ; Jian W. ; Jianzhong Z. ; Qiang S. ; Jianzhuo L.
	2010
会议名称	2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010
会议地点	Changchun, China
关键词	A method using pseudo-random binary pattern is developed for electro-optical imaging system identification. The imaging system is taken as a stable linear time-invariant and causal filter and its transfer function is measured through the pseudo-random binary sequence impulse responses identification. A digital mirror device (DMD) light projector is developed as the target generator and wavelet thresholding is used to denoise the captured image. Pre-filtering spectral estimation algorithm with adaptive parameter selection is also proposed for the identification process overcoming the challenge brought by the size limit derived from the optical isoplantic region. Simulations and experiments are presented to show the effectiveness of the proposed method.0-64. 2010 IEEE.
页码	202-205
收录类别	EI
内容类型	会议论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/33114]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Le Y.,Jian W.,Jianzhong Z.,et al. Electro-optical imaging system identification using pseudo-random binary pattern (EI CONFERENCE)[C]. 见:2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010. Changchun, China.

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