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Simulations of depleted CMOS sensors for high-radiation environments
Liu, J.; Barbero, M.; Bhat, S.; Breugnon, P.; Caicedo, I.; Chen, Z.; Degerli, Y.; Godiot-Basolo, S.; Guilloux, F.; Hemperek, T.
2017
会议名称19th International Workshop on Radiation Imaging Detectors
会议日期JUL 02-06, 2017
关键词Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission etc) Particle tracking detectors (Solid-state detectors) Radiation-hard detectors Solid state detectors
卷号12
期号11
DOI10.1088/1748-0221/12/11/C11013
收录类别CPCI-S ; EI ; SCOPUS ; SCIE
会议录JOURNAL OF INSTRUMENTATION
URL标识查看原文
内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/6029571
专题山东大学
作者单位1.Shandong Univ, Sch Phys, Jinan 250100, Shandong, Peoples R China.
2.Shandong Univ, MOE,
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GB/T 7714
Liu, J.,Barbero, M.,Bhat, S.,et al. Simulations of depleted CMOS sensors for high-radiation environments[C]. 见:19th International Workshop on Radiation Imaging Detectors. JUL 02-06, 2017.
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