Simulations of depleted CMOS sensors for high-radiation environments | |
Liu, J.; Barbero, M.; Bhat, S.; Breugnon, P.; Caicedo, I.; Chen, Z.; Degerli, Y.; Godiot-Basolo, S.; Guilloux, F.; Hemperek, T. | |
2017 | |
会议名称 | 19th International Workshop on Radiation Imaging Detectors |
会议日期 | JUL 02-06, 2017 |
关键词 | Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission etc) Particle tracking detectors (Solid-state detectors) Radiation-hard detectors Solid state detectors |
卷号 | 12 |
期号 | 11 |
DOI | 10.1088/1748-0221/12/11/C11013 |
收录类别 | CPCI-S ; EI ; SCOPUS ; SCIE |
会议录 | JOURNAL OF INSTRUMENTATION |
URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6029571 |
专题 | 山东大学 |
作者单位 | 1.Shandong Univ, Sch Phys, Jinan 250100, Shandong, Peoples R China. 2.Shandong Univ, MOE, |
推荐引用方式 GB/T 7714 | Liu, J.,Barbero, M.,Bhat, S.,et al. Simulations of depleted CMOS sensors for high-radiation environments[C]. 见:19th International Workshop on Radiation Imaging Detectors. JUL 02-06, 2017. |
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