| Optimizing loss of the dielectric stack for Bloch-surface-wave sensors under different interrogation schemes | |
| Kong, Weijing; Wan, Yuhang; Ni, Xiaochang; Zhao, Wenhui; Li, Shuna; Zheng, Zheng | |
| 刊名 | JOURNAL OF MODERN OPTICS
 |
| 2017 | |
| 卷号 | 64页码:407-412 |
| 关键词 | Bloch surface waves optical sensor photonic crystals loss |
| ISSN号 | 0950-0340 |
| DOI | 10.1080/09500340.2016.1241438 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE ; EI |
| WOS记录号 | WOS:000393946600011 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5941768 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Kong, Weijing,Wan, Yuhang,Ni, Xiaochang,et al. Optimizing loss of the dielectric stack for Bloch-surface-wave sensors under different interrogation schemes[J]. JOURNAL OF MODERN OPTICS,2017,64:407-412. |
| APA | Kong, Weijing,Wan, Yuhang,Ni, Xiaochang,Zhao, Wenhui,Li, Shuna,&Zheng, Zheng.(2017).Optimizing loss of the dielectric stack for Bloch-surface-wave sensors under different interrogation schemes.JOURNAL OF MODERN OPTICS,64,407-412. |
| MLA | Kong, Weijing,et al."Optimizing loss of the dielectric stack for Bloch-surface-wave sensors under different interrogation schemes".JOURNAL OF MODERN OPTICS 64(2017):407-412. |
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