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	Evaluation of width and width uniformity of near-field electrospinning printed micro and sub-micrometer lines based on optical image processing
	Zhao, Libo; Xia, Yong; Hebibul, Rahman; Wang, Jiuhong; Zhou, Xiangyang; Hu, Yingjie; Li, Zhikang; Luo, Guoxi; Zhao, Yulong; Jiang, Zhuangde
刊名	JOURNAL OF MICROMECHANICS AND MICROENGINEERING
	2018
卷号	28
关键词	sub-micrometer optical image processing width and width uniformity near-field electrospinning (NFES) process parameters
ISSN号	0960-1317
DOI	10.1088/1361-6439/aaa6a7
URL标识	查看原文
收录类别	SCIE ; EI
WOS记录号	WOS:000424035700001
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5935398
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Zhao, Libo,Xia, Yong,Hebibul, Rahman,et al. Evaluation of width and width uniformity of near-field electrospinning printed micro and sub-micrometer lines based on optical image processing[J]. JOURNAL OF MICROMECHANICS AND MICROENGINEERING,2018,28.
APA	Zhao, Libo.,Xia, Yong.,Hebibul, Rahman.,Wang, Jiuhong.,Zhou, Xiangyang.,...&Jiang, Zhuangde.(2018).Evaluation of width and width uniformity of near-field electrospinning printed micro and sub-micrometer lines based on optical image processing.JOURNAL OF MICROMECHANICS AND MICROENGINEERING,28.
MLA	Zhao, Libo,et al."Evaluation of width and width uniformity of near-field electrospinning printed micro and sub-micrometer lines based on optical image processing".JOURNAL OF MICROMECHANICS AND MICROENGINEERING 28(2018).

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