| Dirac Signature in Germanene on Semiconducting Substrate | |
| Zhuang, Jincheng; Liu, Chen; Zhou, Zhiyong; Casillas, Gilberto; Feng, Haifeng; Xu, Xun; Wang, Jiaou; Hao, Weichang; Wang, Xiaolin; Dou, Shi Xue | |
| 刊名 | ADVANCED SCIENCE
 |
| 2018 | |
| 卷号 | 5页码:1800207 |
| 关键词 | 2D materials Dirac fermions field-effect transistors germanene scanning tunneling microscopy transmission electron microscopy |
| ISSN号 | 2198-3844 |
| DOI | 10.1002/advs.201800207 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE ; EI ; PUBMED |
| WOS记录号 | WOS:000439842100028 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5931361 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Zhuang, Jincheng,Liu, Chen,Zhou, Zhiyong,et al. Dirac Signature in Germanene on Semiconducting Substrate[J]. ADVANCED SCIENCE,2018,5:1800207. |
| APA | Zhuang, Jincheng.,Liu, Chen.,Zhou, Zhiyong.,Casillas, Gilberto.,Feng, Haifeng.,...&Du, Yi.(2018).Dirac Signature in Germanene on Semiconducting Substrate.ADVANCED SCIENCE,5,1800207. |
| MLA | Zhuang, Jincheng,et al."Dirac Signature in Germanene on Semiconducting Substrate".ADVANCED SCIENCE 5(2018):1800207. |
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