QQ客服 官方微博 反馈留言

	A double-electrolyte etching method of high-quality tungsten probe for undergraduate scanning tunneling microscopy and atomic force microscopy experiments
	Li, Yingzi; Song, Zihang; Zhang, Yingxu; Wang, Zhenyu; Xu, Zeyu; Lin, Rui; Qian, Jianqiang
刊名	EUROPEAN JOURNAL OF PHYSICS
	2019
卷号	40
关键词	double-electrolyte etching method tungsten probes scanning tunneling microscopy atomic force microscopy undergraduate experiments
ISSN号	0143-0807
DOI	10.1088/1361-6404/aaf5e4
URL标识	查看原文
收录类别	SCIE ; EI
WOS记录号	WOS:000457529600002
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5922095
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Li, Yingzi,Song, Zihang,Zhang, Yingxu,et al. A double-electrolyte etching method of high-quality tungsten probe for undergraduate scanning tunneling microscopy and atomic force microscopy experiments[J]. EUROPEAN JOURNAL OF PHYSICS,2019,40.
APA	Li, Yingzi.,Song, Zihang.,Zhang, Yingxu.,Wang, Zhenyu.,Xu, Zeyu.,...&Qian, Jianqiang.(2019).A double-electrolyte etching method of high-quality tungsten probe for undergraduate scanning tunneling microscopy and atomic force microscopy experiments.EUROPEAN JOURNAL OF PHYSICS,40.
MLA	Li, Yingzi,et al."A double-electrolyte etching method of high-quality tungsten probe for undergraduate scanning tunneling microscopy and atomic force microscopy experiments".EUROPEAN JOURNAL OF PHYSICS 40(2019).

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。