QQ客服 官方微博 反馈留言

	Stability and Repeatability of a Karst-like Hierarchical Porous Silicon Oxide-Based Memristor
	Gao, Qin; Huang, Anping; Hu, Qi; Zhang, Xinjiang; Chi, Yu; Li, Runmiao; Ji, Yuhang; Chen, Xueliang; Zhao, Rumeng; Wang, Meng
刊名	ACS APPLIED MATERIALS & INTERFACES
	2019
卷号	11页码:21734-21740
关键词	porous karst hierarchical lithium ions silicon oxide memristor
ISSN号	1944-8244
DOI	10.1021/acsami.9b06855
URL标识	查看原文
收录类别	SCIE ; EI ; PUBMED
WOS记录号	WOS:000472683300051
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5918778
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Gao, Qin,Huang, Anping,Hu, Qi,et al. Stability and Repeatability of a Karst-like Hierarchical Porous Silicon Oxide-Based Memristor[J]. ACS APPLIED MATERIALS & INTERFACES,2019,11:21734-21740.
APA	Gao, Qin.,Huang, Anping.,Hu, Qi.,Zhang, Xinjiang.,Chi, Yu.,...&Chu, Paul K..(2019).Stability and Repeatability of a Karst-like Hierarchical Porous Silicon Oxide-Based Memristor.ACS APPLIED MATERIALS & INTERFACES,11,21734-21740.
MLA	Gao, Qin,et al."Stability and Repeatability of a Karst-like Hierarchical Porous Silicon Oxide-Based Memristor".ACS APPLIED MATERIALS & INTERFACES 11(2019):21734-21740.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。