| Investigation of Step-Stress Accelerated Degradation Test Strategy for Ultraviolet Light Emitting Diodes | |
| Liang, Banglong; Wang, Zili; Qian, Cheng; Ren, Yi; Sun, Bo; Yang, Dezhen; Jing, Zhou; Fan, Jiajie | |
| 刊名 | MATERIALS
 |
| 2019 | |
| 卷号 | 12 |
| 关键词 | UV-LED step-stress accelerated tests degradation rate failure mechanism consistency test strategy |
| DOI | 10.3390/ma12193119 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE ; EI ; PUBMED |
| WOS记录号 | WOS:000493308500068 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5915801 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Liang, Banglong,Wang, Zili,Qian, Cheng,et al. Investigation of Step-Stress Accelerated Degradation Test Strategy for Ultraviolet Light Emitting Diodes[J]. MATERIALS,2019,12. |
| APA | Liang, Banglong.,Wang, Zili.,Qian, Cheng.,Ren, Yi.,Sun, Bo.,...&Fan, Jiajie.(2019).Investigation of Step-Stress Accelerated Degradation Test Strategy for Ultraviolet Light Emitting Diodes.MATERIALS,12. |
| MLA | Liang, Banglong,et al."Investigation of Step-Stress Accelerated Degradation Test Strategy for Ultraviolet Light Emitting Diodes".MATERIALS 12(2019). |
| 个性服务 |
| 查看访问统计 |
| 相关权益政策 |
| 暂无数据 |
| 收藏/分享 |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论