| Influence of Sputtering Power on the Structural and Morphological Properties of Semiconducting Mg(2)Si Films | |
| Xiao, Qingquan; Xie, Quan; Yu, Zhiqiang; Zhao, Kejie | |
| 2011 | |
| 会议日期 | JUL 24-26, 2010 |
| 会议地点 | Tsukuba, JAPAN |
| 会议录 | Asia-Pacific Conference on Semiconducting Silicides Science and Technology Towards Sustainable Optoelectronics (APAC-SILICIDE)
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| URL标识 | 查看原文 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5752671 |
| 专题 | 贵州大学 |
| 作者单位 | [1]Guizhou Univ, Coll Sci, Inst Adv Optoelect Mat & Technol, Guiyang 550025, Peoples R China |
| 推荐引用方式 GB/T 7714 | Xiao, Qingquan,Xie, Quan,Yu, Zhiqiang,et al. Influence of Sputtering Power on the Structural and Morphological Properties of Semiconducting Mg(2)Si Films[C]. 见:. Tsukuba, JAPAN. JUL 24-26, 2010. |
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