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	The characterization of fluorine doped tin oxide films by Fourier Transformation Infrared spectrum
	Zhang, B.; Tian, Y.; Zhang, J. X.; Cai, W.
刊名	MATERIALS LETTERS
	2010
卷号	64期号:24页码:2707-2709
关键词	Thin films Defects Spray pyrolysis Plasma frequency
DOI	10.1016/j.matlet.2010.08.065
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5496950
专题	山东大学
作者单位	Shandong Univ, Sch Mat Sci & Engn, Jinan 250061, Shandong, Peoples R China.
推荐引用方式 GB/T 7714	Zhang, B.,Tian, Y.,Zhang, J. X.,et al. The characterization of fluorine doped tin oxide films by Fourier Transformation Infrared spectrum[J]. MATERIALS LETTERS,2010,64(24):2707-2709.
APA	Zhang, B.,Tian, Y.,Zhang, J. X.,&Cai, W..(2010).The characterization of fluorine doped tin oxide films by Fourier Transformation Infrared spectrum.MATERIALS LETTERS,64(24),2707-2709.
MLA	Zhang, B.,et al."The characterization of fluorine doped tin oxide films by Fourier Transformation Infrared spectrum".MATERIALS LETTERS 64.24(2010):2707-2709.

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