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	Defect-Enhanced Charge Separation and Transfer within Protection Layer/Semiconductor Structure of Photoanodes
	Zheng, J.; Lyu, Y.; Xie, C.; Wang, R.; Tao, L.; Wu, H.; Zhou, H.; Jiang, S.; Wang, S.
刊名	Advanced Materials
	2018
卷号	Vol.30 No.31
关键词	charge separation and transfer doping oxygen defects plasma protection layers
ISSN号	0935-9648
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5469163
专题	湖南大学
作者单位	1.a State Key Laboratory of Chem/Bio-Sensing and Chemometrics, College of Chemistry and Chemical Engineering, Hunan University, Changsha, Hunan 410082, China 2.State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 200050, China 3.Fuels and Energy Technology Institute and Department of Chemical Engineering, Curtin University, Perth, WA 6102, Australia
推荐引用方式 GB/T 7714	Zheng, J.,Lyu, Y.,Xie, C.,et al. Defect-Enhanced Charge Separation and Transfer within Protection Layer/Semiconductor Structure of Photoanodes[J]. Advanced Materials,2018,Vol.30 No.31.
APA	Zheng, J..,Lyu, Y..,Xie, C..,Wang, R..,Tao, L..,...&Wang, S..(2018).Defect-Enhanced Charge Separation and Transfer within Protection Layer/Semiconductor Structure of Photoanodes.Advanced Materials,Vol.30 No.31.
MLA	Zheng, J.,et al."Defect-Enhanced Charge Separation and Transfer within Protection Layer/Semiconductor Structure of Photoanodes".Advanced Materials Vol.30 No.31(2018).

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