QQ客服 官方微博 反馈留言

	A Reliability Accelerated Test of High-speed Punch Based on Failure Analysis
	Chen, Lan[1]; Zhang, Xinzhou[2]; Gan, Shuyuan[3]; Wang, Yuan[4]
	2016
会议名称	International Seminar on Applied Physics, Optoelectronics and Photonics (APOP)
会议日期	2016-05-28
收录类别	EI ; CPCI-S
URL标识	查看原文
WOS记录号	WOS:000386721800069
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/5369683
专题	江苏大学
作者单位	1.[1]Jiangsu Univ, Jingjiang Coll, Zhenjiang 212013, Peoples R China. 2.[2]Jiangsu Univ, Sch Mech Engn, Zhenjiang 212013, Peoples R China. 3.[3]Jiangsu Univ, Sch Mech Engn, Zhenjiang 212013, Peoples R China. 4.[4]Jiangsu Univ, Sch Mech Engn, Zhenjiang 212013, Peoples R China.
推荐引用方式 GB/T 7714	Chen, Lan[1],Zhang, Xinzhou[2],Gan, Shuyuan[3],et al. A Reliability Accelerated Test of High-speed Punch Based on Failure Analysis[C]. 见:International Seminar on Applied Physics, Optoelectronics and Photonics (APOP). 2016-05-28.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。