| Estimation of TEM observation time due to conductor covered layer | |
| Hou, Dongyang[1]; Xue, Guoqiang[2]; Zhou, Nan-Nan[3]; Yan, Shu[4] | |
| 2016 | |
| 会议名称 | 7th International Conference on Environmental and Engineering Geophysics (ICEEG) / Summit Forum of Chinese-Academy-of-Engineering-on-Engineering-Science-and-Technology |
| 关键词 | low resistivity Layer shielding effect TEM |
| 页码 | 194-196 |
| 收录类别 | CPCI-S |
| URL标识 | 查看原文 |
| WOS记录号 | WOS:000390177100053 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5362835 |
| 专题 | 江苏大学 |
| 作者单位 | 1.[1]Chinese Acad Sci, Inst Geol & Geophys, Beijing, Peoples R China. 2.[2]Chinese Acad Sci, Inst Geol & Geophys, Beijing, Peoples R China. 3.[3]Chinese Acad Sci, Inst Geol & Geophys, Beijing, Peoples R China. 4.[4]Jiangsu Univ, Sch Comp Sci & Telecommun Engn, Zhenjiang, Peoples R China. |
| 推荐引用方式 GB/T 7714 | Hou, Dongyang[1],Xue, Guoqiang[2],Zhou, Nan-Nan[3],et al. Estimation of TEM observation time due to conductor covered layer[C]. 见:7th International Conference on Environmental and Engineering Geophysics (ICEEG) / Summit Forum of Chinese-Academy-of-Engineering-on-Engineering-Science-and-Technology. |
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