Electron attachment rate constant measurement by photoemission electron attachment ion mobility spectrometry(PE-EA-IMS | |
Desheng Su ; Wenqi Niu ; Sheng Liu ; Chengyin Shen ; Chaoqun Huang ; Hongmei Wang ; Haihe Jiang ; Yannan Chu | |
刊名 | radiation physics and chemistry |
2012 | |
卷号 | 81 |
学科主题 | 光谱分析与技术 |
公开日期 | 2013-01-11 |
内容类型 | 期刊论文 |
源URL | [http://ir.hfcas.ac.cn/handle/334002/9796] |
专题 | 合肥物质科学研究院_中科院安徽光学精密机械研究所 |
推荐引用方式 GB/T 7714 | Desheng Su,Wenqi Niu,Sheng Liu,et al. Electron attachment rate constant measurement by photoemission electron attachment ion mobility spectrometry(PE-EA-IMS[J]. radiation physics and chemistry,2012,81. |
APA | Desheng Su.,Wenqi Niu.,Sheng Liu.,Chengyin Shen.,Chaoqun Huang.,...&Yannan Chu.(2012).Electron attachment rate constant measurement by photoemission electron attachment ion mobility spectrometry(PE-EA-IMS.radiation physics and chemistry,81. |
MLA | Desheng Su,et al."Electron attachment rate constant measurement by photoemission electron attachment ion mobility spectrometry(PE-EA-IMS".radiation physics and chemistry 81(2012). |
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