Electron attachment rate constant measurement by photoemission electron attachment ion mobility spectrometry(PE-EA-IMS
Desheng Su ; Wenqi Niu ; Sheng Liu ; Chengyin Shen ; Chaoqun Huang ; Hongmei Wang ; Haihe Jiang ; Yannan Chu
刊名radiation physics and chemistry
2012
卷号81
学科主题光谱分析与技术
公开日期2013-01-11
内容类型期刊论文
源URL[http://ir.hfcas.ac.cn/handle/334002/9796]  
专题合肥物质科学研究院_中科院安徽光学精密机械研究所
推荐引用方式
GB/T 7714
Desheng Su,Wenqi Niu,Sheng Liu,et al. Electron attachment rate constant measurement by photoemission electron attachment ion mobility spectrometry(PE-EA-IMS[J]. radiation physics and chemistry,2012,81.
APA Desheng Su.,Wenqi Niu.,Sheng Liu.,Chengyin Shen.,Chaoqun Huang.,...&Yannan Chu.(2012).Electron attachment rate constant measurement by photoemission electron attachment ion mobility spectrometry(PE-EA-IMS.radiation physics and chemistry,81.
MLA Desheng Su,et al."Electron attachment rate constant measurement by photoemission electron attachment ion mobility spectrometry(PE-EA-IMS".radiation physics and chemistry 81(2012).
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