| Energy-dependent etching-related impacts on CR-39 alpha detection efficiency for the Rn-222 and Rn-220 decay chains | |
| Tan, Y.*; Yuan, H.*; Kearfott, K. J. | |
| 刊名 | Journal of Instrumentation
 |
| 2018 | |
| 卷号 | 13期号:4页码:T04005 |
| 关键词 | Solid state detectors Particle tracking detectors (Solid-state detectors) |
| ISSN号 | 1748-0221 |
| DOI | 10.1088/1748-0221/13/04/T04005 |
| URL标识 | 查看原文 |
| WOS记录号 | WOS:000430374900002;EI:20182005203685 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5286736 |
| 专题 | 衡阳师范学院 |
| 作者单位 | 1.[Yuan, H. 2.Tan, Y.] Hengyang Normal Univ, Coll Phys & Elect Engn, Hengyang 421008, Hunan, Peoples R China. |
| 推荐引用方式 GB/T 7714 | Tan, Y.*,Yuan, H.*,Kearfott, K. J.. Energy-dependent etching-related impacts on CR-39 alpha detection efficiency for the Rn-222 and Rn-220 decay chains[J]. Journal of Instrumentation,2018,13(4):T04005. |
| APA | Tan, Y.*,Yuan, H.*,&Kearfott, K. J..(2018).Energy-dependent etching-related impacts on CR-39 alpha detection efficiency for the Rn-222 and Rn-220 decay chains.Journal of Instrumentation,13(4),T04005. |
| MLA | Tan, Y.*,et al."Energy-dependent etching-related impacts on CR-39 alpha detection efficiency for the Rn-222 and Rn-220 decay chains".Journal of Instrumentation 13.4(2018):T04005. |
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