| Transient Characteristics of Charging Effects due to E-Beam Irradiation: A Method of SEY-Based Charging Balance Mode | |
| Feng, Guobao; Liu, Lu; Cui, Wanzhao; Wang, Rui; Hu, Tiancun | |
| 2019 | |
| 卷号 | 47页码:3783-3789 |
| 关键词 | Charging balance mode charging effects secondary electron yield (SEY) transient characteristics |
| ISSN号 | 0093-3813 |
| DOI | 10.1109/TPS.2019.2919874 |
| URL标识 | 查看原文 |
| WOS记录号 | WOS:000480316700022 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/4968302 |
| 专题 | 西安理工大学 |
| 推荐引用方式 GB/T 7714 | Feng, Guobao,Liu, Lu,Cui, Wanzhao,et al. Transient Characteristics of Charging Effects due to E-Beam Irradiation: A Method of SEY-Based Charging Balance Mode[J],2019,47:3783-3789. |
| APA | Feng, Guobao,Liu, Lu,Cui, Wanzhao,Wang, Rui,&Hu, Tiancun.(2019).Transient Characteristics of Charging Effects due to E-Beam Irradiation: A Method of SEY-Based Charging Balance Mode.,47,3783-3789. |
| MLA | Feng, Guobao,et al."Transient Characteristics of Charging Effects due to E-Beam Irradiation: A Method of SEY-Based Charging Balance Mode".47(2019):3783-3789. |
| 个性服务 |
| 查看访问统计 |
| 相关权益政策 |
| 暂无数据 |
| 收藏/分享 |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论