Dual-channel phase-shifting interferometry for microscopy with second wavelength assistance
Zheng, Juanjuan1,2; Yao, Baoli1; Rupp, Romano A.3; Ye, Tong1; Gao, Peng1; Min, Junwei1; Guo, Rongli1
刊名chinese optics letters
2012-01-10
卷号10期号:1
ISSN号1671-7694
产权排序1
合作状况国内
英文摘要dual-channel phase-shifting interferometry for simultaneous phase microscopy is presented. red and blue light beams are used for microscope illumination. a 45 degrees tilted beamsplitter replicates the object and reference waves in red light together with the object wave in blue light into two parallel beams. the two resulting quadrature phase-shifting interferograms in red light and the object waves in blue light are generated in the two channels. the two interferograms are recorded simultaneously by a color charge-coupled device (ccd) camera, and can be separated via rob components of the recorded color patterns without crosstalk. as a result, the phase of tested specimen can be retrieved. the feasibility of the proposed method is demonstrated by test performed on a microscopic specimen.
学科主题optics
WOS标题词science & technology ; physical sciences
类目[WOS]optics
研究领域[WOS]optics
关键词[WOS]digital holography ; algorithm ; dynamics ; element
收录类别SCI ; EI
语种英语
WOS记录号WOS:000299248600006
公开日期2012-09-04
内容类型期刊论文
源URL[http://ir.opt.ac.cn/handle/181661/20369]  
专题西安光学精密机械研究所_瞬态光学技术国家重点实验室
作者单位1.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China
2.Chinese Acad Sci, Grad Univ, Beijing 100049, Peoples R China
3.Univ Vienna, Fac Phys, A-1090 Vienna, Austria
推荐引用方式
GB/T 7714
Zheng, Juanjuan,Yao, Baoli,Rupp, Romano A.,et al. Dual-channel phase-shifting interferometry for microscopy with second wavelength assistance[J]. chinese optics letters,2012,10(1).
APA Zheng, Juanjuan.,Yao, Baoli.,Rupp, Romano A..,Ye, Tong.,Gao, Peng.,...&Guo, Rongli.(2012).Dual-channel phase-shifting interferometry for microscopy with second wavelength assistance.chinese optics letters,10(1).
MLA Zheng, Juanjuan,et al."Dual-channel phase-shifting interferometry for microscopy with second wavelength assistance".chinese optics letters 10.1(2012).
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