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Effects of annealing temperature on the microstructure, electrical properties of Fe-doped Na0.5Bi0.5TiO3 thin films
Sui, Huiting; Yang, Changhong; Zhao, Mingshi; Lin, Weiqiang; Feng, Chao
刊名JOURNAL OF ALLOYS AND COMPOUNDS
2014
卷号586页码:683-687
关键词Thin films Chemical synthesis Ferroelectrics
DOI10.1016/j.jallcom.2013.10.117
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4803897
专题山东大学
作者单位1.Univ Jinan, Sch Mat Sci & Engn, Jinan 250022, Peoples R China.
2.[Yang, Cha
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GB/T 7714
Sui, Huiting,Yang, Changhong,Zhao, Mingshi,et al. Effects of annealing temperature on the microstructure, electrical properties of Fe-doped Na0.5Bi0.5TiO3 thin films[J]. JOURNAL OF ALLOYS AND COMPOUNDS,2014,586:683-687.
APA Sui, Huiting,Yang, Changhong,Zhao, Mingshi,Lin, Weiqiang,&Feng, Chao.(2014).Effects of annealing temperature on the microstructure, electrical properties of Fe-doped Na0.5Bi0.5TiO3 thin films.JOURNAL OF ALLOYS AND COMPOUNDS,586,683-687.
MLA Sui, Huiting,et al."Effects of annealing temperature on the microstructure, electrical properties of Fe-doped Na0.5Bi0.5TiO3 thin films".JOURNAL OF ALLOYS AND COMPOUNDS 586(2014):683-687.
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