CORC  > 山东大学
Analysis of the local discontinuous Galerkin method for the drift-diffusion model of semiconductor devices
Liu YunXian; Shu Chi-Wang
刊名中国科学. 数学
2016
卷号59期号:1页码:115-140
关键词local discontinuous Galerkin method semi-discrete implicit-explicit scheme error estimate semiconductor
DOI10.1007/s11425-015-5055-8
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4760042
专题山东大学
作者单位1.School of Mathematics, Shandong University, Jinan, Shandong 250100, China.
2.Division of Applied Mathematics, Brown Universi
推荐引用方式
GB/T 7714
Liu YunXian,Shu Chi-Wang. Analysis of the local discontinuous Galerkin method for the drift-diffusion model of semiconductor devices[J]. 中国科学. 数学,2016,59(1):115-140.
APA Liu YunXian,&Shu Chi-Wang.(2016).Analysis of the local discontinuous Galerkin method for the drift-diffusion model of semiconductor devices.中国科学. 数学,59(1),115-140.
MLA Liu YunXian,et al."Analysis of the local discontinuous Galerkin method for the drift-diffusion model of semiconductor devices".中国科学. 数学 59.1(2016):115-140.
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace