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	Nanoscale imaging of Li and B in nuclear waste glass, a comparison of ToF-SIMS, NanoSIMS, and APT
	Wang, Zhaoying; Liu, Jia; Zhou, Yufan; Neeway, James J.; Schreiber, Daniel K.; Crum, Jarrod V.; Ryan, Joseph V.; Wang, Xue-Lin; Wang, 更多
刊名	SURFACE AND INTERFACE ANALYSIS
	2016
卷号	48期号:13页码:1392-1401
关键词	ToF-SIMS NanoSIMS APT nanoscale imaging lithium boron nuclear waste glass
DOI	10.1002/sia.6049
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4693778
专题	山东大学
作者单位	Chinese Acad Sci, Beijing Ctr Mass Spectrometry, CAS Key Lab Analyt Chem Living Biosyst, Beijing Natl Lab Mol Sci,Inst Ch
推荐引用方式 GB/T 7714	Wang, Zhaoying,Liu, Jia,Zhou, Yufan,et al. Nanoscale imaging of Li and B in nuclear waste glass, a comparison of ToF-SIMS, NanoSIMS, and APT[J]. SURFACE AND INTERFACE ANALYSIS,2016,48(13):1392-1401.
APA	Wang, Zhaoying.,Liu, Jia.,Zhou, Yufan.,Neeway, James J..,Schreiber, Daniel K..,...&Wang, 更多.(2016).Nanoscale imaging of Li and B in nuclear waste glass, a comparison of ToF-SIMS, NanoSIMS, and APT.SURFACE AND INTERFACE ANALYSIS,48(13),1392-1401.
MLA	Wang, Zhaoying,et al."Nanoscale imaging of Li and B in nuclear waste glass, a comparison of ToF-SIMS, NanoSIMS, and APT".SURFACE AND INTERFACE ANALYSIS 48.13(2016):1392-1401.

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