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	Investigation of black phosphorus field-effect transistors and its stability
	Wei, Qinqin; He, Jianting; Yang, Shulian; Jia, Hongyan; Liu, Yunyan; Liu, Wei; Liu, Yang; Li, Tianze
刊名	OPTICAL AND QUANTUM ELECTRONICS
	2016
卷号	48期号:6
关键词	Black phosphorus Field-effect transistors Degradation Passivate
DOI	10.1007/s11082-016-0607-x
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4688512
专题	山东大学
作者单位	Shandong Univ Technol, Coll Elect & Elect Engn, Zibo 255000,
推荐引用方式 GB/T 7714	Wei, Qinqin,He, Jianting,Yang, Shulian,et al. Investigation of black phosphorus field-effect transistors and its stability[J]. OPTICAL AND QUANTUM ELECTRONICS,2016,48(6).
APA	Wei, Qinqin.,He, Jianting.,Yang, Shulian.,Jia, Hongyan.,Liu, Yunyan.,...&Li, Tianze.(2016).Investigation of black phosphorus field-effect transistors and its stability.OPTICAL AND QUANTUM ELECTRONICS,48(6).
MLA	Wei, Qinqin,et al."Investigation of black phosphorus field-effect transistors and its stability".OPTICAL AND QUANTUM ELECTRONICS 48.6(2016).

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